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CHEMICAL VAPOR DEPOSITION (CVD) SYS

by Felix Johnson Seo Activity
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The main element of Scanning Acoustic Microscopy (SAM) is its ability to non-destructively observe the interior of opaque materials with the resolution of an optical light microscope. The demand for non-destructive imaging and materials analysis has increased significantly in recent times. For instance, quality control Inspection and process optimization are paramount for the semiconductor, microelectronics and MEMS industries where SAM technology is now fast becoming the technique of choice. PVA TePla Analytical Systems excels in innovations and developments of advanced solutions applications using Scanning Acoustic Microscopy for both laboratory and production environments.

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About Felix Johnson Innovator   Seo Activity

15 connections, 0 recommendations, 70 honor points.
Joined APSense since, March 11th, 2019, From texas, United States.

Created on Apr 9th 2019 03:00. Viewed 45 times.

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